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Light Conference 2020 International Academic Conference

Speakers

  • Weili Zhang(Symposium 4)

    Oklahoma State University, USA

    All-dielectric Terahertz Metasurfaces and Meta-devices

    Abstract
  • Harald Schneider(Symposium 4)

    Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Germany

    Nonlinear Terahertz Spectroscopy of III-V Semiconductor Quantum Wires and Quantum Wells Using a Free-electron Laser

    Abstract
  • Chris Xu(Symposium 10)

    School of Applied and Engineering Physics, Cornell University, Ithaca,

    Imaging Deeper and Faster: Watching the Brain in Action with Ultrafast Lasers

    Abstract
  • Zhongping Chen(Symposium 10)

    Department of Biomedical Engineering, Beckmann Laser Institute University of California, Irvine, Irvine, CA

    Twenty years of Doppler OCT and OCT angiography: translation of functional OCT technology from bench to bedside

    Abstract
  • Wolfgang Osten( Symposium 1 )

    Institut fuer Technische Optik, Universitaet Stuttgart, Germany

    Optical metrology in times of digital transition

    Abstract
  • Fengzhou Fang(Symposium 1)

    MNMT, Tianjin University/MNMT-Dublin, University College Dublin

    Manufacturing III: Atomic and/or Close-to-atomic Scale Manufacturing

    Abstract
  • Oltmann Riemer(Symposium 1)

    Leibniz Institute for Materials Engineering - Laboratory for Precision Machining LFM, Bremen, Germany

    High-precision Micro-machining of Optical Functional Surfaces

    Abstract
  • Rainer Schuhmann(Symposium 1)

    Berliner Glas KGaA Herbert Kubatz GmbH & Co., Berlin

    From Aspheres to Non-circular Cylindrical Optical Surfaces – manufacturing and Testing

    Abstract
  • Katsuyoshi Endo(Symposium 1)

    Osaka University, Japan

    Non-contact Three-dimensional Profiler with Sub-nanometer Precision Using Normal Vector Method.

    Abstract
  • Sen Han(Symposium 1)

    University of Shanghai for Science and Technology

    Absolute Calibration of Smooth Surface and Cylindrical Surface Measurement

    Abstract
  • Andreas Lange(Symposium 1)

    Mahr GmbH Göttingen, Germany

    Developments in the Field of Asphere and Freeform Measurement

    Abstract
  • Goran Bastian Baer(Symposium 1)

    Baer – Optical Engineering, Germany

    Unification of System Calibration and Optical Design

    Abstract
  • Jane Jiang(Symposium 1)

    University of Huddersfield

    Infrastructure for Freeform Surface Characterization

    Abstract
  • Mitsuo Takeda (Symposium 1)

    Center for Optical Research and Education (CORE), Utsunomiya University, Japan

    Fourier Fringe Analysis Applied to Metrology of Extreme Physical Phenomena: A Review

    Abstract

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