Speakers

1

Weili Zhang（Symposium 4）
Oklahoma State University, USA
All-dielectric Terahertz Metasurfaces and Meta-devices
Abstract
Harald Schneider(Symposium 4)
Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Germany
Nonlinear Terahertz Spectroscopy of III-V Semiconductor Quantum Wires and Quantum Wells Using a Free-electron Laser
Abstract
Chris Xu(Symposium 10)
School of Applied and Engineering Physics, Cornell University, Ithaca,
Imaging Deeper and Faster: Watching the Brain in Action with Ultrafast Lasers
Abstract
Zhongping Chen（Symposium 10）
Department of Biomedical Engineering, Beckmann Laser Institute University of California, Irvine, Irvine, CA
Twenty years of Doppler OCT and OCT angiography: translation of functional OCT technology from bench to bedside
Abstract

1

Wolfgang Osten( Symposium 1 )
Institut fuer Technische Optik, Universitaet Stuttgart, Germany
Optical metrology in times of digital transition
Abstract
Fengzhou Fang（Symposium 1）
MNMT, Tianjin University/MNMT-Dublin, University College Dublin
Manufacturing III: Atomic and/or Close-to-atomic Scale Manufacturing
Abstract
Oltmann Riemer（Symposium 1）
Leibniz Institute for Materials Engineering - Laboratory for Precision Machining LFM, Bremen, Germany
High-precision Micro-machining of Optical Functional Surfaces
Abstract
Rainer Schuhmann（Symposium 1）
Berliner Glas KGaA Herbert Kubatz GmbH & Co., Berlin
From Aspheres to Non-circular Cylindrical Optical Surfaces – manufacturing and Testing
Abstract
Katsuyoshi Endo（Symposium 1）
Osaka University, Japan
Non-contact Three-dimensional Profiler with Sub-nanometer Precision Using Normal Vector Method.
Abstract
Sen Han（Symposium 1）
University of Shanghai for Science and Technology
Absolute Calibration of Smooth Surface and Cylindrical Surface Measurement
Abstract
Andreas Lange（Symposium 1）
Mahr GmbH Göttingen, Germany
Developments in the Field of Asphere and Freeform Measurement
Abstract
Goran Bastian Baer（Symposium 1）
Baer – Optical Engineering, Germany
Unification of System Calibration and Optical Design
Abstract
Jane Jiang（Symposium 1）
University of Huddersfield
Infrastructure for Freeform Surface Characterization
Abstract
Mitsuo Takeda （Symposium 1）
Center for Optical Research and Education (CORE), Utsunomiya University, Japan
Fourier Fringe Analysis Applied to Metrology of Extreme Physical Phenomena: A Review
Abstract