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Light Conference 2020 International Academic Conference


  • Jeffrey R. Kuhn

    University of Hawaii, USA

    Title: Beyond the World’s Largest Telescopes: New Technologies and New Opportunities

  • Neal J. Brock

    4D Technology, Tucson, Arizona, USA

    Title: The Remarkable Technological Progress in the Inspection of High-precision Optical Surfaces Under Harsh Environmental Conditions Enabled by Instantaneous Phase Measuring Technology.

  • Peter de Groot

    Zygo Corporation

    Challenges and Solutions for the Interferometric Measurement of Aspherical and Freeform Optics

  • Werner Schmutz

    Physikalisch-Meteorologischen Observatorium Davos und Weltstrahlungszentrum (PMOD/WRC);ETH Zurich

    Title: The solar influence on the terrestrial climate

  • Eric Tournié

    IES, Université de Montpellier, CNRS, France

    Epitaxial Integration of GaSb-based mid-IR devices on Silicon

  • N. Kamaraju(Symposium 9)

    Indian Institute of Science Education Research Kolkata

    NIR femtosecond pulses to probe electron -phonon dynamics in condensed matter systems

  • Cunzhu Tong

    Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, China.

    Mode Engineering of High Power Semiconductor Lasers

  • Jianshun Tang

    CAS Key Laboratory of Quantum Information, University of Science and Technology of China

    A bubble-induced ultrastable and robust single-photon emitter in hexagonal boron nitride

  • Weili Zhang(Symposium 4)

    Oklahoma State University, USA

    All-dielectric Terahertz Metasurfaces and Meta-devices

  • Harald Schneider(Symposium 4)

    Helmholtz-Zentrum Dresden-Rossendorf (HZDR), Germany

    Nonlinear Terahertz Spectroscopy of III-V Semiconductor Quantum Wires and Quantum Wells Using a Free-electron Laser

  • Chris Xu(Symposium 10)

    School of Applied and Engineering Physics, Cornell University, Ithaca,

    Imaging Deeper and Faster: Watching the Brain in Action with Ultrafast Lasers

  • Zhongping Chen(Symposium 10)

    Department of Biomedical Engineering, Beckmann Laser Institute University of California, Irvine, Irvine, CA

    Twenty years of Doppler OCT and OCT angiography: translation of functional OCT technology from bench to bedside

  • Xing Zhao(Symposium 5)

    Institute of ModernOptics, Nankai University, Tianjin, China

    Model of radial basis functions with slope-based shape factor and distribution for optical freeform surface

  • Peng Yao(Symposium 5)

    Shandong University, China

    High Efficiency and Precision Machining of RB-SiC with Fluid Jet

  • Benny C.F. Cheung(Symposium 5)

    State Key Laboratory of Ultra-precision Machining Technology, Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong, China

    Advances in the Ultra-precision Machining and Measurement of Optical Freeform and Structured Surfaces and Applications

  • Chao Wang(Symposium 5)

    Changchun University of Science and Technology, China

    Aberration correction technology for aspheric window optical system

  • Feng Shi(Symposium 5)

    National University of Defense Technology, China

    Intelligent manufacturing equipment and process for complex shape nano-precision optical components

  • Lingjie Wang(Symposium 5)

    Changchun Institute of Optics, Fine Mechanics and Physics Chinese Academy

    Distortion optimization design of free-form large field camera

  • Jun Zhu (Symposium 5)

    Tsinghua University, China

    Design method for freeform optical systems containing diffraction gratings

  • Guogan Liu(Symposium 5)

    Shanghai modern advanced Ultra Precision Manufacturing Center Co., Ltd,China

    High-precision thin spherical surface lens manufactuing

  • Dong Liu(Symposium 5)

    State Key Lab. of Modern Optical Instrumentation, College of Optical Science and Engineering, Zhejiang University, Hangzhou, Zhejiang 310027, China

    Interferometric measurement of freeform surface using irregular subaperture stitching

  • Qun Hao(Symposium 5)

    Beijing Institute of Technology, China

    Partial compensation interferometry for freeform measurment: progress and challenge